EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
EDN

Electroglas Intros Automated Defect Classification

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...
Semiconductor Engineering

Demystifying ADC

ADC stands for automatic defect classification. It’s a software that classifies defects based on image and metadata such as location, ROI, and other information associated with a defect. ADC is not a ...
Semiconductor Engineering

Defect Image Classification And Detection With Deep Learning

Inspection means have increasingly been incorporated into typical manufacturing of boards, substrates and/or systems. A significant number of automatic inspections rely on the analysis of images that ...
Digi Times

SPIL achieves well in applying AI to detect packaging defects

Siliconware Precision Industries (SPIL) has achieved satisfactory results from applying AI to detect defects on packaging lines following nine months of efforts, according to KH Wan, director of ...