Abstract: This article uses mymargin a track structure theory (TST) model for the calculation of proton single event upsets (SEU) cross sections from heavy-ion data. The model is evaluated using data ...
Abstract: Static random access memories (SRAMs) are prone to a single-event upset (SEU), also known as soft errors, due to transient noise caused by a single strike of radiation. Beam testing has been ...
In Pinus taeda L. species, U-Net model do not segment the pith pixel correctly. In such species, pith can be model as a single pixel (see paper). #single imagefile ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback